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IEC 60749-13:2018 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
15. 2. 2018.

Опште информације

60.60     15. 2. 2018.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Objavljen

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Apstrakt

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-13:2002 ED1

POVUČEN
IEC 60749-13:2002/COR1:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-13:2018 ED2
60.60 Standard objavljen
15. 2. 2018.

Nacionalna preuzimanja

SRPS EN IEC 60749-13:2018  
ISS

Poluprovodničke komponente – Metode mehaničkih i klimatskih ispitivanja – Deo 13: Slana magla

60.60   Standard objavljen

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