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Glavni meni

IEC 60749-33:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
9. 3. 2004.

Опште информације

60.60     9. 3. 2004.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62172:2000 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-33:2004 ED1
60.60 Standard objavljen
9. 3. 2004.