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IEC 60749-6:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
12. 4. 2002.

Опште информације

99.60     3. 3. 2017.

WPUB   

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62205:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-6:2002 ED1
99.60 Povlačenje stupilo na snagu
3. 3. 2017.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-6:2002/COR1:2003 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-6:2017 ED2