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IEC 63616:2025 ED1

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
28. 11. 2025.

Опште информације

60.60     28. 11. 2025.

IEC

TC 46/SC 46F

Međunarodni standard

17.220.20     29.050  

engleski   francuski  

Kupovina

Objavljen

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Apstrakt

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 63616:2025 ED1
60.60 Standard objavljen
28. 11. 2025.

Nacionalna preuzimanja

dnaSRPS EN IEC 61169-73:2023  
ISS

Merenje provodljivosti za tanke metalne filmove na frekvencijama mikro i milimetarskih talasnih dužina metodom balansiranog tipa cirkularnog disk rezonatora

50.60   Završetak postupka odobravanja definitivnog teksta nacrta standarda

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