IEC 62899-202-13 ED1 specifies a test pattern as well as resistance and thickness measurement methods for the conductive layer in printed and in-mould-electronics.
PROJEKAT
IEC 62899-202-13 ED1
50.20
Početak postupka odobravanja definitivnog teksta nacrta standarda
31. 7. 2026.
Da biste videli ceo sadržaj, morate se registrovati ili prijaviti pomoću korisničkog imena koje već imate.