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IEC PAS 62396-2:2007 ED1

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
18. 9. 2007.

Опште информације

99.60     19. 8. 2008.

IEC

TC 107

Javno dostupna specifikacija

03.100.50     31.020     49.060  

engleski  

Kupovina

Zamenjen

Jezik na kome želite da primite dokument.

Apstrakt

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Životni ciklus

TRENUTNO

POVUČEN
IEC PAS 62396-2:2007 ED1
99.60 Povlačenje stupilo na snagu
19. 8. 2008.

REVIDIRAN OD

POVUČEN
IEC TS 62396-2:2008 ED1

OBJAVLJEN
IEC 62396-2:2017 ED2