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Glavni meni

IEC TS 62396-2:2008 ED1

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
19. 8. 2008.

Опште информације

99.60     27. 9. 2012.

IEC

TC 107

Tehnička specifikacija

03.100.50     31.020     49.060  

engleski  

Kupovina

Zamenjen

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Apstrakt

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62396-2:2007 ED1

TRENUTNO

POVUČEN
IEC TS 62396-2:2008 ED1
99.60 Povlačenje stupilo na snagu
27. 9. 2012.

REVIDIRAN OD

POVUČEN
IEC 62396-2:2012 ED1

OBJAVLJEN
IEC 62396-2:2017 ED2