IEC 60749-29:2011 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Datum objavljivanja: 7. 4. 2011.

Опште информације

Trenutna faza: 60.60 Effective date: 7. 4. 2011.

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski

Kupovina

Status: Objavljen

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Apstrakt

IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include:
- a number of minor technical changes;
- the addition of two new annexes covering the testing of special pins and temperature calculations.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-29:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-29:2011 ED2
60.60 Standard objavljen
7. 4. 2011.

REVIDIRAN OD

PROJEKAT
IEC 60749-29 ED3