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IEC 60749-29:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
4. 11. 2003.

Опште информације

99.60     7. 4. 2011.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

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Apstrakt

Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62181:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-29:2003 ED1
99.60 Povlačenje stupilo na snagu
7. 4. 2011.

REVIDIRAN OD

OBJAVLJEN
IEC 60749-29:2011 ED2