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IEC 62047-10:2011 ED1

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
26. 7. 2011.

Опште информације

60.60     26. 7. 2011.

IEC

TC 47/SC 47F

Međunarodni standard

31.080.99  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 62047-10:2011 specifies micro-pillar compression test method to measure compressive properties of MEMS materials with high accuracy, repeatability, and moderate effort of specimen fabrication. The uniaxial compressive stress-strain relationship of a specimen is measured, and the compressive modulus of elasticity and yield strength can be obtained. This standard is applicable to metallic, ceramic, and polymeric materials. The contents of the corrigendum of February 2012 have been included in this copy.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62047-10:2011 ED1
60.60 Standard objavljen
26. 7. 2011.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 62047-10:2011/COR1:2012 ED1