IEC TS 62916:2017 ED1

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

Datum objavljivanja: 10. 4. 2017.

Опште информације

Trenutna faza: 60.60 Effective date: 10. 4. 2017.

Inicijator: IEC

Pripada: TC 82

Vrsta: Tehnička specifikacija

ICS: 27.160

Jezik: engleski

Kupovina

Status: Objavljen

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Apstrakt

IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC TS 62916:2017 ED1
60.60 Standard objavljen
10. 4. 2017.