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Glavni meni

IEC 62951-6:2019 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
6. 5. 2019.

Опште информације

60.60     6. 5. 2019.

IEC

TC 47

Međunarodni standard

31.080.99  

engleski   francuski  

Kupovina

Objavljen

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Apstrakt

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62951-6:2019 ED1
60.60 Standard objavljen
6. 5. 2019.