IEC 60749-4:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Datum objavljivanja: 3. 3. 2017.

Опште информације

Trenutna faza: 60.60 Effective date: 3. 3. 2017.

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski

Kupovina

Status: Objavljen

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Apstrakt

IEC 60749-4:2017 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. This edition includes the following significant technical changes with respect to the previous edition:
a) clarification of requirements for temperature, relative humidity and duration detailed in Table 1;
b) recommendations that current limiting resistor(s) be placed in the test set-up to prevent test board or DUT damage;
c) allowance of additional time-to-test delay or return-to-stress delay.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-4:2002 ED1

POVUČEN
IEC 60749-4:2002/COR1:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-4:2017 ED2
60.60 Standard objavljen
3. 3. 2017.