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Glavni meni

IEC 60749-5:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
10. 4. 2017.

Опште информације

99.60     19. 12. 2023.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-5:2003 ED1

TRENUTNO

POVUČEN
IEC 60749-5:2017 ED2
99.60 Povlačenje stupilo na snagu
19. 12. 2023.

REVIDIRAN OD

OBJAVLJEN
IEC 60749-5:2023 ED3