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ISO 15632:2002

Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
25. 11. 2002.
95.99   Povučen   31. 7. 2012.

Опште информације

95.99     31. 7. 2012.

ISO

ISO/TC 202

Međunarodni standard

71.040.99     37.020  

engleski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.

Životni ciklus

TRENUTNO

POVUČEN
ISO 15632:2002
95.99 Povučen
31. 7. 2012.

REVIDIRAN OD

POVUČEN
ISO 15632:2012