Povučen
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
POVUČEN
ISO 24173:2009
95.99
Povučen
9. 2. 2024.
OBJAVLJEN
ISO 24173:2024