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Glavni meni

ISO 17470:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
6. 1. 2014.

Опште информације

90.92     3. 3. 2025.

ISO

ISO/TC 202/SC 2

Međunarodni standard

71.040.99  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Životni ciklus

PRETHODNO

POVUČEN
ISO 17470:2004

TRENUTNO

OBJAVLJEN
ISO 17470:2014
90.92 Odluka o izmeni ili reviziji standarda
3. 3. 2025.

REVIDIRAN OD

PROJEKAT
ISO/AWI 17470