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Glavni meni

ISO/TS 22933:2022

Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
1. 4. 2022.

Опште информације

90.92     15. 11. 2025.

ISO

ISO/TC 201/SC 6

Tehnička specifikacija

71.040.40  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.

Životni ciklus

TRENUTNO

OBJAVLJEN
ISO/TS 22933:2022
90.92 Odluka o izmeni ili reviziji standarda
15. 11. 2025.

REVIDIRAN OD

PROJEKAT
ISO/AWI TS 22933