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ISO/AWI TS 22933

Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS

Опште информације

10.99     15. 11. 2025.

ISO

ISO/TC 201/SC 6

Tehnička specifikacija

Apstrakt

This document specifies a method for measuring the mass resolution in SIMS, and how to compare the mass resolution between different instruments (e.g. TOF-SIMS, Magnetic SIMS, Quadrupole SIMS, Fourier Transform SIMS, etc.) by considering the peak shapes.

Životni ciklus

PRETHODNO

OBJAVLJEN
ISO/TS 22933:2022

TRENUTNO

PROJEKAT
ISO/AWI TS 22933
10.99 Novi projekat se prihvata
15. 11. 2025.