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ISO/AWI 26665

Microbeam analysis--Preparation of sectional specimens for metallic materials using focused ion beam

Опште информације

20.00     12. 6. 2026.

ISO

ISO/TC 202

Međunarodni standard

Apstrakt

This document specifies the equipment, sample pretreatment, preparation conditions, and procedures of preparing sectional specimens by using focused ion beam (FIB) technique. This document applies to the preparation of sectional specimens of metal materials, including substrates, surface coatings, and corrosion layers. Other materials may refer to this document for guidance.

Životni ciklus

TRENUTNO

PROJEKAT
ISO/AWI 26665
20.00 Novi projekat upisuje se u plan rada komisije za standarde
12. 6. 2026.