Projekti

Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

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Amendment 1 - Connectors for electronic equipment - Tests and measurements - Part 26-100: Measurement setup, test and reference arrangements and measurements for connectors according to IEC 60603-7 - Tests 26a to 26g

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Connectors for electronic equipment - Tests and measurements - Part 27-100: Signal integrity tests up to 500 MHz on 60603-7 series connectors - Tests 27a to 27g

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Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

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Connectors for electrical and electronic equipment - Tests and measurements - Part 28-100: Signal integrity tests up to 2 000 MHz - Tests 28a to 28g

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Connectors for electronic equipment - Tests and measurements - Part 29-100: Signal integrity tests up to 500 MHz on M12 style connectors - Tests 29a to 29g

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Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance

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Connectors for electronic equipment - Tests and measurements - Part 4-1: Voltage stress tests - Test 4a: Voltage proof

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Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge

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Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels

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Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise

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Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

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Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state

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Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump

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Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock

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Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal)

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Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 6: Dynamic stress tests - Section 5: Test 6e: Random vibration

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Connectors for electronic equipment - Tests and measurements - Part 7-1: Impact tests (free connectors) - Test 7a: Free fall (repeated)

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