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Pretražite srpske, evropske i međunarodne standarde. Odredite organizaciju koja je donosilac standarda, izaberite oznaku standarda ili ključnu reč i završite željenu pretragu. Možete dodati i fazu u izradi standarda ili komitet/komisiju koja je izradila standard.

Multimedia security - Guideline for privacy protection of equipment and systems in and out of use - Part 1: General

60.60   Standard objavljen

TC 100 Saznaj više

Safety of machinery - Application of protective equipment to detect the presence of persons

60.60   Standard objavljen

TC 44 Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates

60.60   Standard objavljen

TC 47/SC 47F Saznaj više

Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area

60.60   Standard objavljen

TC 47/SC 47F Saznaj više