Projekti

Fragment 3: Radiated limits from 150 kHz to 30 MHz

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Fragment 4: Introduction of E-field measurements below 30 MHz

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Fragment 5: Conducted limits below 150 kHz

20.99   Prednacrt standarda prihvata se kao nacrt standarda

<p>3D displays - Part 22-3: Measuring methods for autostereoscopic displays - Ambient properties</p>

10.60   Završetak izjašnjavanja o predlogu

Corrective lens for AR/VR

00.00   Podnet predlog novog projekta

Future of IEC 62629-502-1: Measurement method of plane-symmetrical real-image-forming optics for aerial display

00.00   Podnet predlog novog projekta

Measurement method of holographic display- optical

00.00   Podnet predlog novog projekta

Optical components of AR eyewear display

00.00   Podnet predlog novog projekta

Evaluation of qualified viewing space of displays

00.00   Podnet predlog novog projekta

Liquid crystal display devices - Part 31-1: Measurement methods of static halo - Verification of the measurement

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Measurement methods of autostereoscopic displays - Image quality

00.00   Podnet predlog novog projekta

Eyewear display - Measurement methods of specific functions with motion sensors

00.00   Podnet predlog novog projekta

Future of IEC TR 62595-1-7 Characteristics of RGB backlight units in field sequential colour LCD

00.00   Podnet predlog novog projekta

Green House Gas (GHG) emissions - Quantification methodology tor electronic display modules

00.00   Podnet predlog novog projekta

Determination of certain substances in electrotechnical products - Part 16: Benzotriazole ultraviolet absorbers in plastics by Gas chromatography-mass spectrometry (GC-MS)

10.20   Početak izjašnjavanja o predlogu

IEC TS62607-9.3 -Nanomanufacturing – Key Control Characteristics - Part 9-3: Traceable spatially resolved nano-scale magnetic field measurements - Scanning Nitrogen vacancy (NV) center nanomagnetometry

00.00   Podnet predlog novog projekta

IEC TS 62876-3-3 Nanomanufacturing – Reliability assessment – Part 3-3: 2D materials – Stability test: Density of interface defects

00.00   Podnet predlog novog projekta

Nanotechnologies – Nano-enabled computational spectroscopic devices

00.00   Podnet predlog novog projekta