Projekti

Medical electrical equipment - Dosimeters with ionization chambers or solid-state detectors as used in radiotherapy

40.00   Dopunjavanje i evidentiranje podataka o nacrtu standarda

Amendment 1 - Household electrical appliances - Performance - Water for testing

40.20   Nacrt na javnoj raspravi 60 dana

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-2: Blank detail specification - Heating element application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 16-11: Microwave integrated circuits - Power detectors

60.00   Standard u postupku objavljivanja

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes

50.99   Definitivni tekst nacrta standarda odobren za objavljivanje

Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.20   Nacrt na javnoj raspravi 60 dana

Standard test procedures for semiconductor X-ray energy spectrometers

20.99   Prednacrt standarda prihvata se kao nacrt standarda