Projekti
Pretražite srpske, evropske i međunarodne standarde. Odredite organizaciju koja je donosilac standarda, izaberite oznaku standarda ili ključnu reč i završite željenu pretragu. Možete dodati i fazu u izradi standarda ili komitet/komisiju koja je izradila standard.
Switching device for islanding (SDFI)
60.00
Standard u postupku objavljivanja
Fully flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
LED lamps – Safety requirements
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
LED Light sources – Performance requirements
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
Coupled-stress acceleration test sequence for photovoltaic modules and materials
50.00
Evidentiranje podataka o definitivnom tekstu nacrta standarda
Concentric lay overhead electrical stranded conductors
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
Excimer sources for germicidal purpose - Safety specifications
30.99
Nacrt komisije standarda odobrava se za javnu raspravu
Measurement of ozone production from UV-C radiation sources and luminaires
20.99
Prednacrt standarda prihvata se kao nacrt standarda
Germicidal equipment - Low-pressure mercury UV radiation sources for germicidal purpose - Safety specifications
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
Electrical safety of Snow melting photovoltaic (Snow PV) module - Requirements for construction and testing
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
Visual comfort of display terminals - Part 1: Introduction
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
40.60
Završetak javne rasprave
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
30.99
Nacrt komisije standarda odobrava se za javnu raspravu
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.20
Nacrt na javnoj raspravi 60 dana
Quantum Interconnect – Part 1: Introduction and roadmap for standardization
50.00
Evidentiranje podataka o definitivnom tekstu nacrta standarda
High-level test description table for development of production test programs
40.99
Nacrt standarda prihvata se kao definitivni tekst nacrta standarda
Guideline of High-Level Test Description Table for Development of Production Test Programs
50.00
Evidentiranje podataka o definitivnom tekstu nacrta standarda
Rotating electrical machines for the traction of road vehicles
30.60
Završetak izjašnjavanja o nacrtu komisije standarda
