Projekti

Application driven Communication Use Cases and Requirements

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Refrigerant detection systems for flammable refrigerants

40.99   Nacrt standarda prihvata se kao definitivni tekst nacrta standarda

Photovoltaic (PV) module safety qualification for DC system voltage up to 3 000 V DC - Part 1: Requirements for construction

40.99   Nacrt standarda prihvata se kao definitivni tekst nacrta standarda

Photovoltaic (PV) module safety qualification for DC system voltage up to 3 000 V DC - Part 2: Requirements for testing

40.99   Nacrt standarda prihvata se kao definitivni tekst nacrta standarda

Horticultural lighting – Luminaires incorporating LED sources for horticultural lighting - Performance

40.60   Završetak javne rasprave

Required Specification Of Package Substrates For Advanced Semiconductor Packaging - Part 1: Current-Induced Quality Test Method for Package Substrate

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Bushing application guide - Part 1: Bushing selection and installation

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Neuromorphic devices - Part 1: Evaluation method of basic characteristics in memristor devices

40.60   Završetak javne rasprave

Semiconductor devices - Neuromorphic devices - Part 2: Evaluation method of linearity in memristor devices

40.60   Završetak javne rasprave

Semiconductor devices - Neuromorphic devices - Part 3: Evaluation method of spike dependent plasticity in memristor devices

40.60   Završetak javne rasprave

Semiconductor devices - Neuromorphic devices - Part 4: Evaluation method of asymmetry in memristor devices

40.60   Završetak javne rasprave

<p>Semiconductor devices - Neuromorphic devices - Part 5: Evaluation method of endurance and retention in memristor devices</p>

20.99   Prednacrt standarda prihvata se kao nacrt standarda

<p>Semiconductor devices-Neuromorphic devices - Part 6：Evaluation method of basic characteristics in one transistor one memristor (1T1M) arrays</p>

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR

30.20   Početak izjašnjavanja o nacrtu komisije standarda

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 3: Thermal imagers

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 6: Visual Imaging devices

30.99   Nacrt komisije standarda odobrava se za javnu raspravu