Projekti

Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Micro-electromechanical devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices

50.20   Početak postupka odobravanja definitivnog teksta nacrta standarda

Semiconductor devices - Micro-electromechanical devices - Part 54: Silicon based MEMS fabrication technology – Measurement method of tensile strength of microstructures

40.20   Nacrt na javnoj raspravi 60 dana

Semiconductor devices - Micro-electromechanical devices - Part 55: Silicon based MEMS fabrication technology - Test method of microstructure pendulum impact

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Micro-electromechanical devices - Part 56: Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

60.00   Standard u postupku objavljivanja

Semiconductor devices - Micro-electromechanical systems - Part 57: RF MEMS directional coupler

40.20   Nacrt na javnoj raspravi 60 dana

Semiconductor devices - Micro-electromechanical systems - Part 58: Test methods for performances of MEMS thermopile devices

40.20   Nacrt na javnoj raspravi 60 dana

Semiconductor devices - Micro-electromechanical systems-Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

40.20   Nacrt na javnoj raspravi 60 dana

Semiconductor devices - Micro-electromechanical systems - Part 60: Test methods for sensing performances of MEMS resonant electric-field-sensitive devices

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Micro-electromechanical systems - Part 61: Evaluation methods of localized deformation and stretchability for Hybrid MEMS materials

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Micro-electromechanical systems - Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Micro-electromechanical systems - Part 63: Tensile test method for shape-memory characteristics of MEMS materials under thermomechanical loading

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Micro-electromechanical devices - Part 64: Test methods of Terahertz sensing antenna-coupled MEMS bolometer

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Micro-electromechanical devices - Part 65: Test methods for electrical stimulation environment and Electrophysiological measurement using 3D Cell-tissues Models with MEMS chips

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Electricity metering equipment - General requirements, tests and test conditions - Part 11: Metering equipment

40.60   Završetak javne rasprave

Accuracy test method for static electricity meters under dynamic load conditions

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Electricity metering equipment - Particular requirements - Part 21: Static meters for AC active energy (classes 0,5, 1 and 2)

40.60   Završetak javne rasprave

Electricity metering equipment - Particular requirements - Part 22: Static meters for AC active energy (classes 0,1S, 0,2S and 0,5S)

40.60   Završetak javne rasprave