IEC 60749-17:2019 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Datum objavljivanja: 28. 3. 2019.

Опште информације

Trenutna faza: 60.60 Effective date: 28. 3. 2019.

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski

Kupovina

Status: Objavljen

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Apstrakt

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
This edition includes the following significant technical changes with respect to the previous edition:
updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose;
addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-17:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-17:2019 ED2
60.60 Standard objavljen
28. 3. 2019.

Nacionalna preuzimanja

SRPS EN IEC 60749-17:2020

ISS

Poluprovodničke komponente - Metode mehaničkih i klimatskih ispitivanja - Deo 17: Neutronsko zračenje

60.60 Standard objavljen

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