99.60 4. 11. 2003.
IEC
TC 47
Javno dostupna specifikacija
engleski
Zamenjen
Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.
POVUČEN
IEC PAS 62181:2000 ED1
99.60
Povlačenje stupilo na snagu
4. 11. 2003.
POVUČEN
IEC 60749-29:2003 ED1