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Glavni meni

IEC 60749-23:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
30. 3. 2011.

Опште информације

99.60     9. 12. 2025.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62189:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-23:2004 ED1
99.60 Povlačenje stupilo na snagu
9. 12. 2025.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-23:2004/AMD1:2011 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-23:2025 ED2