0 Stavka
Moj nalog
Telefon: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Prodaja standarda: prodaja@iss.rs Seminari, obuke: iss-edukacija@iss.rs Informacije o standardima: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Glavni meni

IEC 60749-27:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
21. 10. 2003.

Опште информације

99.60     18. 7. 2006.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed.
The testing shall be selected from this test method or the human body model (see IEC 60749-26).

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62180:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-27:2003 ED1
99.60 Povlačenje stupilo na snagu
18. 7. 2006.

REVIDIRAN OD

OBJAVLJEN
IEC 60749-27:2006 ED2