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Glavni meni

IEC 60749-27:2006 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
25. 9. 2012.

Опште информације

60.60     18. 7. 2006.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-27:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-27:2006 ED2
60.60 Standard objavljen
18. 7. 2006.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 60749-27:2006/AMD1:2012 ED2