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Glavni meni

IEC 60749-41:2020 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
22. 7. 2020.

Опште информације

60.60     22. 7. 2020.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 60749-41:2020 ED1
60.60 Standard objavljen
22. 7. 2020.

Nacionalna preuzimanja

SRPS EN IEC 60749-41:2020  
ISS

Poluprovodničke komponente - Metode mehaničkih i klimatskih ispitivanja - Deo 41: Metode ispitivanja pouzdanosti nepromenljivih memorijskih komponenti

60.60   Standard objavljen

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