IEC 60749-3:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Datum objavljivanja: 3. 3. 2017.

Опште информације

Trenutna faza: 60.60 Effective date: 3. 3. 2017.

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski

Kupovina

Status: Objavljen

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Apstrakt

IEC 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.
This edition includes the following significant technical changes with respect to the previous edition:
a) reference to the need for ESD protection;
b) inclusion of information on the phenomenon of tin whiskers;
c) inclusion of an optional report form/checklist.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-3:2002 ED1

POVUČEN
IEC 60749-3:2002/COR1:2003 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-3:2017 ED2
60.60 Standard objavljen
3. 3. 2017.