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ISO/TR 15969:2001

Surface chemical analysis — Depth profiling — Measurement of sputtered depth
31. 5. 2001.
95.99   Povučen   17. 3. 2021.

Опште информације

95.99     17. 3. 2021.

ISO

ISO/TC 201/SC 4

Tehnički izveštaj

71.040.40  

engleski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

This Technical Report gives guidelines for measuring the sputtered depth in sputtered depth profiling. The methods
of sputtered depth measurement described in this Technical Report are applicable to techniques of surface
chemical analysis when used in combination with ion bombardment for the removal of a part of a solid sample to a
typical sputtered depth of up to severalmicrometres.

Životni ciklus

TRENUTNO

POVUČEN
ISO/TR 15969:2001
95.99 Povučen
17. 3. 2021.

REVIDIRAN OD

OBJAVLJEN
ISO/TR 15969:2021