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ISO 16700:2004

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
5. 3. 2004.
95.99   Povučen   18. 7. 2016.

Опште информације

95.99     18. 7. 2016.

ISO

ISO/TC 202/SC 4

Međunarodni standard

37.020  

engleski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.

Životni ciklus

TRENUTNO

POVUČEN
ISO 16700:2004
95.99 Povučen
18. 7. 2016.

REVIDIRAN OD

OBJAVLJEN
ISO 16700:2016