40.98 15. 5. 2018.
30.99 10. 11. 2017.
ISS
Evropski standard
IEC 63011-1:2018 provides definitions pertaining to multichip integrated circuits, as vertically stacked dies using through-silicon vias (TSVs) or micro bumps. Terms and definitions related to the fabrication and test of the multichip integrated circuits are also provided.
NAPUŠTEN
delSRPS EN 63011-1:2017
40.98
Projekat se briše iz plana rada komisije za standarde
15. 5. 2018.