Projekti

Fragment 4: Introduction of E-field measurements below 30 MHz

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Fragment 5: Conducted limits below 150 kHz

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Electronic displays - Part 3-10: Evaluation of optical performance - Qualified viewing space

10.20   Početak izjašnjavanja o predlogu

International Electrotechnical Vocabulary (IEV) - Part xxx-02: Electronic technologies and systems - Fundamental concepts of Virtual, Augmented and Mixed Realities

10.20   Početak izjašnjavanja o predlogu

Corrective lens for AR/VR

00.00   Podnet predlog novog projekta

Future of IEC 62629-502-1: Measurement method of plane-symmetrical real-image-forming optics for aerial display

00.00   Podnet predlog novog projekta

Measurement method of holographic display- optical

00.00   Podnet predlog novog projekta

Optical components of AR eyewear display

00.00   Podnet predlog novog projekta

Measurement methods of autostereoscopic displays - Image quality

00.00   Podnet predlog novog projekta

Eyewear display - Measurement methods of specific functions with motion sensors

00.00   Podnet predlog novog projekta

Future of IEC TR 62595-1-7 Characteristics of RGB backlight units in field sequential colour LCD

00.00   Podnet predlog novog projekta

Determination of certain substances in electrotechnical products - Part 16: Benzotriazole ultraviolet absorbers in plastics by Gas chromatography-mass spectrometry (GC-MS)

10.60   Završetak izjašnjavanja o predlogu

Nanomanufacturing - Key control characteristics – Part 11-7: Shielding effectiveness of nano-composites based on dielectric nanoparticles: Free-space method

10.20   Početak izjašnjavanja o predlogu

IEC TS62607-9.3 -Nanomanufacturing – Key Control Characteristics - Part 9-3: Traceable spatially resolved nano-scale magnetic field measurements - Scanning Nitrogen vacancy (NV) center nanomagnetometry

00.00   Podnet predlog novog projekta

IEC TS 62876-3-3 Nanomanufacturing – Reliability assessment – Part 3-3: 2D materials – Stability test: Density of interface defects

00.00   Podnet predlog novog projekta

Nanotechnologies – Nano-enabled computational spectroscopic devices

00.00   Podnet predlog novog projekta

IEC TS 62565-4-x: Nanomanufacturing – Product specifications - Part 4-x: Quantum dot materials enabled optical diffuser plates - Blank detail specification

00.00   Podnet predlog novog projekta

62607-2-x: Nanomanufacturing - Key control characteristics - Part 2-x: Multi-walled carbon nanotubes - Far-field shielding effectiveness

00.00   Podnet predlog novog projekta