0 Stavka
Moj nalog
Telefon: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Prodaja standarda: prodaja@iss.rs Seminari, obuke: iss-edukacija@iss.rs Informacije o standardima: infocentar@iss.rs Sertifikaciono telo: sertifikaciono.telo@iss.rs
Stevana Brakusa 2, 11030 Beograd
Glavni meni

ISO/AWI 22278

Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam

Опште информације

10.99     20. 10. 2026.

ISO

ISO/TC 206

Međunarodni standard

Apstrakt

This document specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with parallel X-ray beam. This document is applicable to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure.

Životni ciklus

PRETHODNO

OBJAVLJEN
ISO 22278:2020

TRENUTNO

PROJEKAT
ISO/AWI 22278
10.99 Novi projekat se prihvata
20. 10. 2026.